Transient measurements with an ultrafast scanning tunneling microscope on semiconductor surfaces

Ultrafast Scanning Tunneling Microscopy

Simulating Scanning Tunneling Microscope

Recent Developments in Scanning Tunneling Spectroscopy of Semiconductor Surfaces

Several recent developments in scanning tunneling spectroscopy (STS) of semiconductor surfaces are reviewed. First, the normalization of spectra is discussed, which for the Si(111)2×1 surface is found to produce a small shift in the apparent position of band edges. With this correction, the surface band gap measured by STS is found to be in good agreement with that obtained by other experimenta...

Nanometer scale patterning and oxidation of silicon surfaces with an ultrahigh vacuum scanning tunneling microscope

Supporting Information: Single-Molecule Imaging of DNA Duplex Immobilized on Surfaces with Scanning Tunneling Microscope